AERI President to present at International Symposium for Testing and Failure Analysis

October 4, 2010 | CATEGORY: AERI News

The Electronic Component Test Community is trying to stay abreast of the latest threats and solutions to the counterfeit electronic component issues. AERI President Robert Hammond will be part of a panel to discuss the independent distributor perspective on the problem. For more details go to; http://asmcommunity.asminternational.org/content/Events/istfa/